Amplitude modulation atomic force microscopy based on higher flexural modes
نویسندگان
چکیده
منابع مشابه
Spatial horizons in amplitude and frequency modulation atomic force microscopy.
In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation atomic force microscopy (AM-AFM and FM-AFM) have established themselves as the most powerful methods in the field. Nevertheless, it is still debatable whether one or the other technique is preferred in a g...
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Electrostatic force measurement at the micro/nano scale is of great significance in science and engineering. In this paper, a reasonable way of applying voltage is put forward by taking an electrostatic chuck in a real integrated circuit manufacturing process as a sample, applying voltage in the probe and the sample electrode, respectively, and comparing the measurement effect of the probe osci...
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The authors demonstrate that the compositional sensitivity of an atomic force microscope is enhanced by the simultaneous excitation of its first two flexural eigenmodes. The coupling of those modes by the nonlinear probe-surface interactions enables to map compositional changes in several conjugated molecular materials with a phase shift sensitivity that is about one order of magnitude higher t...
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Wear is one of the main factors that hinders the performance of probes for atomic force microscopy (AFM), including for the widely used amplitude modulation (AM-AFM) mode. Unfortunately, a comprehensive scientific understanding of nanoscale wear is lacking. We have developed a protocol for conducting consistent and quantitative AM-AFM wear experiments. The protocol involves controlling the tip-...
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ژورنال
عنوان ژورنال: AIP Advances
سال: 2017
ISSN: 2158-3226
DOI: 10.1063/1.5004732